ABLESTIK 84-1LMINB

Harmonization Code : 3506.91.90.99 | Prepared glues and other prepared adhesives, not elsewhere specified or included; products suitable for use as glues or adhesives, put up for retail sale as glues or adhesives, not exceeding a net weight of 1 kg ; Adhesives based on polymers of headings 3901 to 3913 or on rubber; Other ; Other

ABLESTIK 84-1LMINB

Main features

  • 0.0001 ohm-cm Volume Resistivity
  • Screen-Printable Epoxy Bonding
  • 30-Minute Working Window

Product Description

LOCTITE ABLESTIK 84-1LMINB is a silver-filled, electrically conductive, one-component epoxy adhesive designed for semiconductor die attach. The solvent-free material can be applied by automatic dispenser, screen printing, or hand probe and has a typical Brookfield viscosity of 60,000 mPa.s (cP) at 25 degC and 5 rpm. It provides a three-day work life at 25 degC and cures in 30 minutes at 150 degC. The cured adhesive combines low electrical resistivity with documented thermal, mechanical, ionic, and outgassing performance.

Key Features

  • Silver-filled electrically conductive epoxy for die attach
  • One-component, solvent-free formulation
  • Automatic dispense, screen print, or hand-probe application
  • Typical viscosity of 60,000 mPa.s (cP) at 25 degC and 5 rpm
  • Three-day work life at 25 degC
  • Recommended cure of 30 minutes at 150 degC
  • Typical volume resistivity of 0.0001 ohm-cm after cure

Applications / Suitable for

  • Semiconductor die attach
  • Electrically conductive die-to-substrate attachment
  • Automatic dispensing and screen-print die attach processes
  • Applications requiring a high-purity, silver-filled attach adhesive
Product Family

ABLESTIK 84-1LMINB

Catalog Product

Unlike other products we offer, the products listed on this page cannot currently be ordered directly from the website.

TDS, SDS & Technical Documents

Technical Specifications

General Properties
Chemistry TypeChemistry Type
Epoxy
Work life @25°CWork life @25°C
72 hours
Thermal Properties
Glass Transition Temperature (Tg)Glass Transition Temperature (Tg)
117 °C
Thermal ConductivityThermal Conductivity
4.5 W/m.K
Electrical Properties
Volume ResistivityVolume Resistivity
0.0001 Ohms⋅cm

Additional Information

Electrically Conductive Die Attach Adhesive

LOCTITE ABLESTIK 84-1LMINB

LOCTITE ABLESTIK 84-1LMINB is a silver-filled, one-component epoxy adhesive developed for semiconductor die attach. The solvent-free paste supports automatic dispensing, screen printing, and hand-probe application, with a three-day work life at 25 degC and a recommended 30-minute cure at 150 degC.

Silver filled Electrically conductive One component Solvent free Die attach

As-Supplied Die Attach Paste

As-Supplied Properties

The as-supplied material is a silver, high-purity epoxy paste. Its viscosity and work-life data are important process-selection parameters for dispensing and printing operations.

Viscosity
60,000 mPa.s

Brookfield CP51, 25 degC, 5 rpm.

Work life
3 days

Typical work life at 25 degC.

Filler
Silver

Electrically conductive filler system.

Typical as-supplied properties and storage life
Property Typical value Condition / context
Technology Epoxy One-component heat-cure system
Appearance Silver As supplied
Viscosity 60,000 mPa.s (cP) Brookfield CP51, 25 degC, 5 rpm
Work life 3 days 25 degC
Shelf life 183 days -10 degC, from date of manufacture
Shelf life 365 days -40 degC, from date of manufacture

Conditioning, Application and Cure

Processing and Cure

Before use, allow the frozen adhesive to reach room temperature while the syringe remains vertical. Do not open the container until the contents reach 25 degC, and remove any moisture from the outside of the thawed container before opening. Once thawed to 25 degC, the adhesive should not be re-frozen.

Application methodsAutomatic dispenser, screen print, or hand probe.
AssemblyApply the adhesive as required, assemble the bond, and maintain the intended die placement and bondline geometry.
Recommended cure30 minutes at 150 degC.

The supplied TDS includes a syringe-size-dependent thawing graph for 1 cc, 3 cc, 10 cc, and 30 cc packages. Because the graph does not provide a tabulated dataset, exact intermediate thaw-time values are not reconstructed here.

Storage and Handling

Optimal storage is -40 degC in the unopened container and a dry location. The TDS reports 365 days of shelf life at -40 degC and 183 days at -10 degC. Storage above or below the stated optimal -40 degC may adversely affect product properties. Keep the container closed, avoid contamination, and do not return removed material to the original container.

Final Attach Layer

Cured Properties

The cured material combines electrical conductivity, thermal conductivity, controlled thermal expansion, and high-temperature glass-transition behavior. These are typical bulk-material values and should not be converted into package-level thermal or electrical performance without assembly-specific evidence.

Volume resistivity
0.0001 ohm-cm

Typical cured bulk electrical property.

Thermal conductivity
4.5 W/(m-K)

Typical cured value at 121 degC.

Glass transition
117 degC

Typical Tg reported in the TDS.

Typical cured physical, thermal, electrical, and ionic properties
Property Typical result Method / condition
Coefficient of thermal expansion 52 ppm/degC TMA, below Tg
Coefficient of thermal expansion 150 ppm/degC TMA, above Tg
Glass transition temperature 117 degC Typical cured value
Thermal conductivity 4.5 W/(m-K) 121 degC
Volume resistivity 0.0001 ohm-cm Cured material
Chloride extractable ionic content 80 Reported TDS value; unit not stated in supplied source
Sodium extractable ionic content 25 Reported TDS value; unit not stated in supplied source
Potassium extractable ionic content 5 Reported TDS value; unit not stated in supplied source
Water extract conductivity 15 umhos/cm Reported TDS value
pH 4.4 Water extract context

Die Attach and Environmental Data

Performance Evidence

The manufacturer reports die shear on a defined Au-to-Au specimen and NASA outgassing results. These values are specific to their stated test configurations and should not be generalized to other die sizes, metallizations, package geometries, or qualification conditions.

Die shear strength

10 kg-f/die

2 x 2 mm (80 x 80 mil) Au-to-Au specimen, tested at 25 degC.

NASA TML

0.9%

Typical total mass loss reported under NASA outgassing testing.

NASA CVCM

0.02%

Typical collected volatile condensable material result.

NASA WVR

0.07%

Typical water vapor regained result.

Documented Assembly Role

Applications

Semiconductor Die Attach

Designed specifically for attaching semiconductor die using an electrically conductive cured bondline.

Automated Material Deposition

Supports automatic dispenser and screen-print processes, with hand-probe application also documented.

Conductive Attach Evaluation

The silver-filled formulation supports evaluation where an electrically conductive die attach layer is required. Final suitability remains dependent on die size, metallization, bondline, cure, and package design.

Technical Support for LOCTITE ABLESTIK 84-1LMINB

Discuss frozen-material handling, syringe thawing, dispensing or printing, die placement, cure profiling, bondline control, metallization compatibility, and package-level thermal or electrical evaluation with Krayden. Process trials should confirm performance in the intended die, substrate, finish, geometry, and assembly conditions.

Contact Krayden Technical Support

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